Calculation of the electronic loading scheme for testing low voltage sources
DOI:
https://doi.org/10.15588/1607-6761-2022-2-4Keywords:
electronic load, MOSFET, solar cells, testing system, automationAbstract
Purpose. The introduction of electronic load for testing high-precision low-voltage sources (solar panels) requires careful review not only of the circuit design, but also thermal and mechanical design. The article considers the principle of creating and calculating the optimal solution for the implementation of electronic load.
Methodology. To achieve this goal, methods of analysis of modern electronic database, calculations of basic physical and electrical parameters and their modeling are used.
Findings. Based on the considered physical and circuit solutions for the implementation of the electronic load unit, a corresponding electrical circuit was developed. The transistors are controlled by four unipolar operational amplifiers integrated into the LM324 chip. Control of the electronic load unit is implemented by controlling the voltage at the positive feedback terminals, which is further stabilized by the TL431 chip. The device is powered by a source of DC stabilized current of 12 V (provides additional filtering from voltage fluctuations).
Originality. Modern advances in the development of solar cells and other low-voltage energy sources have led to the need to create compact and express systems for testing them, which cannot be implemented on existing solutions.
Practical value. Adherence to the indications and principles set out in this article will provide the load with the ability to work at high power, while maintaining good performance and reliability. The developed scheme allows to create a compass device for express testing of solar panels.
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Copyright (c) 2022 R.V. Zaitsev, M.V. Kirichenko, K.O. Minakova, R.S. Tomashevskii, V.O. Nikitin, M.M. Kharchenko
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